繁體中文
ENGLISH
QE-R PV/太陽能電池量子效率光學儀
The QE-R Quantum Efficiency System is a PV cell tester that can provide accurate and rapid data on a cell’s EQE, IPCE, IQE, and spectral response. The quantum efficiency information provided by the QE-R Quantum Efficiency System is commonly used by PV researchers to illustrate and study device design, device performance, process improvement, material bandgap, impurities, or traps.
Due to the high repeatability and accuracy of the QE-R Quantum Efficiency System, metrology engineers also use it to perform spectral mismatch calculations and uncertainty evaluations of PV conversion efficiency. The QE-R Quantum Efficiency System has been adopted by over 500 outstanding PV research laboratories and has been mentioned in over 1,000 SCI papers in the past 10 years, including many flagship journals like Nature, Science, Joule, and Advanced Materials, among others.
Due to the high repeatability and accuracy of the QE-R Quantum Efficiency System, metrology engineers also use it to perform spectral mismatch calculations and uncertainty evaluations of PV conversion efficiency. The QE-R Quantum Efficiency System has been adopted by over 500 outstanding PV research laboratories and has been mentioned in over 1,000 SCI papers in the past 10 years, including many flagship journals like Nature, Science, Joule, and Advanced Materials, among others.
- For single junction solar cells testing: Perovskite solar cells, Organic solar cells, Si HJT cells, TOP-Con cells, CIGS, CzTs, CdS, GaAs, thin-film cells.
- For tandem solar cells testing: Perovskite / Si tandem cells, Perovskite / CIGS tandem cells, concentrated solar cells, III-V tandem solar cells.
- Wavelength range: 300 ~ 1100 nm; 300~1800 nm; 300 ~ 2500 nm or customized
- Provides data in QE (quantum efficiency), PV-EQE (external quantum efficiency), IPCE (incident photon-to-electron conversion efficiency), SR (spectral response), IQE (internal quantum efficiency), Reflectance.
- Compact and High Repeatability over 99.5%.
- Two independent lock-in amplifiers (each one is dual-phase) which monitor the optical power and measure the device signal simultaneously.
- Exclusive integrated computer-controlled signal switch can reduce costs for maintenance and consumables.
- Exclusive glovebox integration capability.
- Complies with ATSM E 1021-15, ASTM E948, IEC 60904-8, IEC 60904-7, IEC 60904-1.
- NIST-traceable SI traceable chain.
- Exclusive EQE uncertainty evaluation report and quality control accredited by ISO / IEC 17025 for journal paper submission.
- Various and customized sample test fixtures.
| Lamp Wavelength Range | 300nm~2500nm |
| Measuring Wavelength Range | 300nm~1100nm 300nm~1800nm 300nm~2500nm |
| Beam Spot Area | 1 x 1 mm2 |
| Effective Working Distance | > 10 cm |
| DSP Lock-in Amplifier | Two sets of dual-phase lock-in amplifiers |
| Software | a. Absolute light intensity calibration b. SR, EQE measuring c. Auto in-situ Jsc(EQE) calculation d. Auto Jsc(EQE) calculation at each wavelength e. IQE calculation f. Bandgap analysis g. Data collecting and analyzing h. Mismatch factor (MMF) calculation i. Signal monitoring function j. txt data format |
| Signal Oscilloscope | Oscilloscope display |
| Dark box | 600mm x 600mm x 607mm |